본문 바로가기
주메뉴 바로가기
Home
Location
Introduction
About Lab
Contact Us
Members
Professor
Ph.D. Student
M.S. Student
Intern
Alumni
Research
Prognostics and Health Management
Industrial AI
Design under Uncertainty
Project
Publications
International Journal
Domestic Journal
International Conference
Domestic Conference
Patent
Community
Notice / News
Equipment
Album
Lecture
Gwangju Institute of Science and Technology
Smart Diagnosis and Design Optimization Laboratory
Publications
International Journal
Domestic Journal
International Conference
Domestic Conference
Patent
> Publications >
International Journal
International Journal
Title
Test Scheme and Degradation Model of Accumulated ESD Damage for IGBT Prognostics
Journal
IEEE Transactions on Device and Material Reliability
Authors
J. Lee, H. Oh*, C. H. Park, B. D. Youn*, and B. Han
Date
2019.03.
Citation Index
SCIE, SCOPUS, EI (IF: 1.512, Rank: 59.80%)
Vol. / Page
Vol.19, pp.233-241
File
Link
Visits
1204
Previous
TDR-based Multiple Leak Detection System using an S-parameter Transmission Line Model for Long-Distance Pipelines
Next
Review of Statistical Model Calibration and Validation - From The Perspective of Uncertainty Structures
List
비밀번호 입력
비밀번호
확인
비밀번호 입력
비밀번호
확인