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Gwangju Institute of Science and Technology
Smart Diagnosis and Design Optimization Laboratory
Publications
International Journal
Domestic Journal
International Conference
Domestic Conference
Patent
> Publications >
International Conference
International Conference
Title
Model Refinement for Fracture Failure Prediction of Smartphone LCD with Unrecognized Blind Uncertainty
Conference
11th World Congress on Structural and Multidisciplinary Optimization
Authors
H. Oh, J. Kim, J. Park, B. D. Youn, and B. C. Jung
Date
2015.06.
Presentation Type
Vol. / Page
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