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Gwangju Institute of Science and Technology

Smart Diagnosis and Design Optimization Laboratory

Publications

> Publications > International Journal

International Journal

	Title	An Empirical Model to Describe Performance Degradation for Warranty Abuse Detection in Portable Electronics
	Journal	Reliability Engineering & System Safety
	Authors	H. Oh, S. Choi, K. Kim, B. D. Youn*, and M. Pecht
	Date	2015.10.
	Citation Index	SCIE, SCOPUS, EI (IF: 2.410, Rank: 9.14%)
	Vol. / Page	Vol. 142, pp. 92-99
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