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Gwangju Institute of Science and Technology

Smart Diagnosis and Design Optimization Laboratory

Publications

> Publications > International Journal

International Journal

	Title	Test Scheme and Degradation Model of Accumulated ESD Damage for IGBT Prognostics
	Journal	IEEE Transactions on Device and Material Reliability
	Authors	J. Lee, H. Oh, C. H. Park, B. D. Youn, and B. Han
	Date	2019.03.
	Citation Index	SCIE, SCOPUS, EI (IF: 1.512, Rank: 59.80%)
	Vol. / Page	Vol.19, pp.233-241
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